Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma. Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. In 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. pages 11-17, IEEE Computer Society, 2003. [doi]
@inproceedings{ZhaoDHM03,
title = {Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip},
author = {Tianxu Zhao and Xuchao Duan and Yue Hao and Peijun Ma},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/dft/2003/2042/00/20420011abs.htm},
tags = {rule-based, reliability},
researchr = {https://researchr.org/publication/ZhaoDHM03},
cites = {0},
citedby = {0},
pages = {11-17},
booktitle = {18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-2042-1},
}