Impact of finger numbers on the performance of proton-radiated SiGe power HBTs at room and cryogenic temperatures

Zheng Zhao, Ningyue Jiang, Zhenqiang Ma, Guoxuan Qin. Impact of finger numbers on the performance of proton-radiated SiGe power HBTs at room and cryogenic temperatures. Microelectronics Reliability, 91:194-200, 2018. [doi]

Authors

Zheng Zhao

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Ningyue Jiang

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Zhenqiang Ma

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Guoxuan Qin

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