Zheng Zhao, Ningyue Jiang, Zhenqiang Ma, Guoxuan Qin. Impact of finger numbers on the performance of proton-radiated SiGe power HBTs at room and cryogenic temperatures. Microelectronics Reliability, 91:194-200, 2018. [doi]
@article{ZhaoJMQ18,
title = {Impact of finger numbers on the performance of proton-radiated SiGe power HBTs at room and cryogenic temperatures},
author = {Zheng Zhao and Ningyue Jiang and Zhenqiang Ma and Guoxuan Qin},
year = {2018},
doi = {10.1016/j.microrel.2018.10.006},
url = {https://doi.org/10.1016/j.microrel.2018.10.006},
researchr = {https://researchr.org/publication/ZhaoJMQ18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {91},
pages = {194-200},
}