Impact of finger numbers on the performance of proton-radiated SiGe power HBTs at room and cryogenic temperatures

Zheng Zhao, Ningyue Jiang, Zhenqiang Ma, Guoxuan Qin. Impact of finger numbers on the performance of proton-radiated SiGe power HBTs at room and cryogenic temperatures. Microelectronics Reliability, 91:194-200, 2018. [doi]

Abstract

Abstract is missing.