Yi Zhao, S. Saqib Khursheed, Bashir M. Al-Hashimi. Cost-Effective TSV Grouping for Yield Improvement of 3D-ICs. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 201-206, IEEE Computer Society, 2011. [doi]
Abstract is missing.