Jun Zhao, Fred J. Meyer, Fabrizio Lombardi. Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models. In 8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, CA, USA. pages 14-19, IEEE Computer Society, 2000. [doi]
@inproceedings{ZhaoML00,
title = {Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models},
author = {Jun Zhao and Fred J. Meyer and Fabrizio Lombardi},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/mtdt/2000/0689/00/06890014abs.htm},
researchr = {https://researchr.org/publication/ZhaoML00},
cites = {0},
citedby = {0},
pages = {14-19},
booktitle = {8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-0689-5},
}