Jun Zhao, Fred J. Meyer, Fabrizio Lombardi. Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models. In 8th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2000), 7-8 August 2000, San Jose, CA, USA. pages 14-19, IEEE Computer Society, 2000. [doi]
Abstract is missing.