Wei Zhao, Junxia Ma, Mohammad Tehranipoor, Sreejit Chakravarty. Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 301-306, IEEE Computer Society, 2010. [doi]
@inproceedings{ZhaoMTC10, title = {Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test}, author = {Wei Zhao and Junxia Ma and Mohammad Tehranipoor and Sreejit Chakravarty}, year = {2010}, doi = {10.1109/ATS.2010.58}, url = {http://dx.doi.org/10.1109/ATS.2010.58}, tags = {testing}, researchr = {https://researchr.org/publication/ZhaoMTC10}, cites = {0}, citedby = {0}, pages = {301-306}, booktitle = {Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China}, publisher = {IEEE Computer Society}, isbn = {978-0-7695-4248-5}, }