Jiaqi Zhao, Xiaolong Qian, Yunzhou Zhang, Dexing Shan, Xiaozheng Liu, Sonya Coleman, Dermot Kerr. A knowledge distillation-based multi-scale relation-prototypical network for cross-domain few-shot defect classification. J. Intelligent Manufacturing, 35(2):841-857, February 2024. [doi]
Abstract is missing.