Statistical rare event analysis using smart sampling and parameter guidance

Yue Zhao, Hosoon Shin, Hai-Bao Chen, Sheldon X.-D. Tan, Guoyong Shi, Xin Li. Statistical rare event analysis using smart sampling and parameter guidance. In 28th IEEE International System-on-Chip Conference, SOCC 2015, Beijing, China, September 8-11, 2015. pages 53-58, IEEE, 2015. [doi]

Abstract

Abstract is missing.