Mingyue Zheng, Wangyong Chen, Yaoyang Lyu, Haifeng Chen, Jiahui Chen, Linlin Cai. Enhancing Temperature Immunity of Digital Circuit Against Aging : The Standard Cell Subset Method. In 15th IEEE International Conference on ASIC, ASICON 2023, Nanjing, China, October 24-27, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.