Hui Zheng, Lawrence T. Pileggi, Michael W. Beattie, Byron Krauter. Window-Based Susceptance Models for Large-Scale RLC Circuit Analyses. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 628-633, IEEE Computer Society, 2002. [doi]
Abstract is missing.