Xiaoyan Zheng, Tong Sang, Ruohui Chen, Zeng Zeng. Enhancing Semiconductor Chip Image Defect Classification Using Deep Learning and Segmented Defect Region Information. In IEEE International Conference on Cybernetics and Intelligent Systems, CIS 2023 and IEEE Conference on Robotics, Automation and Mechatronics, RAM 2023, Penang, Malaysia, June 9-12, 2023. pages 204-209, IEEE, 2023. [doi]
Abstract is missing.