SACCI: Scan-Based Characterization Through Clock Phase Sweep for Counterfeit Chip Detection

Yu Zheng, Xinmu Wang, Swarup Bhunia. SACCI: Scan-Based Characterization Through Clock Phase Sweep for Counterfeit Chip Detection. IEEE Trans. VLSI Syst., 23(5):831-841, 2015. [doi]

Abstract

Abstract is missing.