Shi-Xuan Zheng, Chung-Yu Yeh, Kuen-Jong Lee, Chen Wang 0014, Wu-Tung Cheng, Mark Kassab, Janusz Rajski, Sudhakar M. Reddy. Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
Abstract is missing.