A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects

Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi. A Fast and Accurate Process Variation-Aware Modeling Technique for Resistive Bridge Defects. IEEE Trans. on CAD of Integrated Circuits and Systems, 30(11):1719-1730, 2011. [doi]

Abstract

Abstract is missing.