Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi. Impact of PVT variation on delay test of resistive open and resistive bridge defects. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 230-235, IEEE, 2013. [doi]
Abstract is missing.