Shida Zhong, S. Saqib Khursheed, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Krishnendu Chakrabarty. Analysis of Resistive Bridge Defect Delay Behavior in the Presence of Process Variation. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 389-394, IEEE Computer Society, 2011. [doi]
Abstract is missing.