Scalable Compositional Static Taint Analysis for Sensitive Data Tracing on Industrial Micro-Services

Zexin Zhong, Jiangchao Liu, Diyu Wu, Peng Di, Yulei Sui, Alex X. Liu, John C. S. Lui. Scalable Compositional Static Taint Analysis for Sensitive Data Tracing on Industrial Micro-Services. In 45th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, SEIP@ICSE 2023, Melbourne, Australia, May 14-20, 2023. pages 110-121, IEEE, 2023. [doi]

Authors

Zexin Zhong

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Jiangchao Liu

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Diyu Wu

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Peng Di

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Yulei Sui

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Alex X. Liu

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John C. S. Lui

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