Zexin Zhong, Jiangchao Liu, Diyu Wu, Peng Di, Yulei Sui, Alex X. Liu, John C. S. Lui. Scalable Compositional Static Taint Analysis for Sensitive Data Tracing on Industrial Micro-Services. In 45th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, SEIP@ICSE 2023, Melbourne, Australia, May 14-20, 2023. pages 110-121, IEEE, 2023. [doi]
@inproceedings{ZhongLWDSLL23,
title = {Scalable Compositional Static Taint Analysis for Sensitive Data Tracing on Industrial Micro-Services},
author = {Zexin Zhong and Jiangchao Liu and Diyu Wu and Peng Di and Yulei Sui and Alex X. Liu and John C. S. Lui},
year = {2023},
doi = {10.1109/ICSE-SEIP58684.2023.00015},
url = {https://doi.org/10.1109/ICSE-SEIP58684.2023.00015},
researchr = {https://researchr.org/publication/ZhongLWDSLL23},
cites = {0},
citedby = {0},
pages = {110-121},
booktitle = {45th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, SEIP@ICSE 2023, Melbourne, Australia, May 14-20, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0037-6},
}