Zexin Zhong, Jiangchao Liu, Diyu Wu, Peng Di, Yulei Sui, Alex X. Liu, John C. S. Lui. Scalable Compositional Static Taint Analysis for Sensitive Data Tracing on Industrial Micro-Services. In 45th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, SEIP@ICSE 2023, Melbourne, Australia, May 14-20, 2023. pages 110-121, IEEE, 2023. [doi]
Abstract is missing.