Parameter and UVM, making a layered testbench powerful

Geng Zhong, Jian Zhou, Bei Xia. Parameter and UVM, making a layered testbench powerful. In IEEE 10th International Conference on ASIC, ASICON 2013, Shenzhen, China, October 28-31, 2013. pages 1-4, IEEE, 2013. [doi]

Abstract

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