Fault Detection for Testable Realizations of Multiple-Valued Logic Functions

Pan Zhongliang. Fault Detection for Testable Realizations of Multiple-Valued Logic Functions. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 242-249, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.