Xingye Zhou, Zhihong Feng, Yuanjie Lv, Xin Tan, Yuangang Wang, Guodong Gu, Xubo Song, Peng Xu, Shaobo Dun, Shujun Cai. Dependency of current collapse on the device structure of GaN-based HEMTs. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.