Ziqi Zhou, Ujjwal Guin, Peng Li, Vishwani D. Agrawal. Fault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
@inproceedings{ZhouGLA22,
title = {Fault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits},
author = {Ziqi Zhou and Ujjwal Guin and Peng Li and Vishwani D. Agrawal},
year = {2022},
doi = {10.1109/VTS52500.2021.9794254},
url = {https://doi.org/10.1109/VTS52500.2021.9794254},
researchr = {https://researchr.org/publication/ZhouGLA22},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022},
publisher = {IEEE},
isbn = {978-1-6654-1060-1},
}