Ziqi Zhou, Ujjwal Guin, Peng Li, Vishwani D. Agrawal. Fault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
Abstract is missing.