AccMon: Automatically Detecting Memory-Related Bugs via Program Counter-Based Invariants - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Pin Zhou, Wei Liu, Long Fei, Shan Lu, Feng Qin, Yuanyuan Zhou, Samuel P. Midkiff, Josep Torrellas. AccMon: Automatically Detecting Memory-Related Bugs via Program Counter-Based Invariants. In 37th Annual International Symposium on Microarchitecture (MICRO-37 2004), 4-8 December 2004, Portland, OR, USA. pages 269-280, IEEE Computer Society, 2004. [doi]

This author has not been identified. Look up 'Pin Zhou' in GoogleThis author has not been identified. Look up 'Wei Liu' in GoogleThis author has not been identified. Look up 'Long Fei' in GoogleThis author has not been identified. Look up 'Shan Lu' in GoogleThis author has not been identified. Look up 'Feng Qin' in GoogleThis author has not been identified. Look up 'Yuanyuan Zhou' in GoogleThis author has not been identified. Look up 'Samuel P. Midkiff' in GoogleThis author has not been identified. Look up 'Josep Torrellas' in Google

runs on WebDSL