Pin Zhou, Wei Liu, Long Fei, Shan Lu, Feng Qin, Yuanyuan Zhou, Samuel P. Midkiff, Josep Torrellas. AccMon: Automatically Detecting Memory-Related Bugs via Program Counter-Based Invariants. In 37th Annual International Symposium on Microarchitecture (MICRO-37 2004), 4-8 December 2004, Portland, OR, USA. pages 269-280, IEEE Computer Society, 2004. [doi]
Abstract is missing.