Ying Zhou, Zhuo Li, Yuxin Tian, Weiping Shi, Frank Liu. A New Methodology for Interconnect Parasitics Extraction Considering Photo-Lithography Effects. In Proceedings of the 12th Conference on Asia South Pacific Design Automation, ASP-DAC 2007, Yokohama, Japan, January 23-26, 2007. pages 450-455, IEEE, 2007. [doi]
Abstract is missing.