Monitoring chip fatigue in an IGBT module based on grey relational analysis - researchr publication authors

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Shengqi Zhou, Luowei Zhou, Litao Yu, Sucheng Liu, Quanming Luo, Pengju Sun, Junke Wu. Monitoring chip fatigue in an IGBT module based on grey relational analysis. Microelectronics Reliability, 56:49-52, 2016. [doi]

This author has not been identified. Look up 'Shengqi Zhou' in GoogleThis author has not been identified. Look up 'Luowei Zhou' in GoogleThis author has not been identified. Look up 'Litao Yu' in GoogleThis author has not been identified. Look up 'Sucheng Liu' in GoogleThis author has not been identified. Look up 'Quanming Luo' in GoogleThis author has not been identified. Look up 'Pengju Sun' in GoogleThis author has not been identified. Look up 'Junke Wu' in Google

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