Shengqi Zhou, Luowei Zhou, Litao Yu, Sucheng Liu, Quanming Luo, Pengju Sun, Junke Wu. Monitoring chip fatigue in an IGBT module based on grey relational analysis. Microelectronics Reliability, 56:49-52, 2016. [doi]
@article{ZhouZYLLSW16,
title = {Monitoring chip fatigue in an IGBT module based on grey relational analysis},
author = {Shengqi Zhou and Luowei Zhou and Litao Yu and Sucheng Liu and Quanming Luo and Pengju Sun and Junke Wu},
year = {2016},
doi = {10.1016/j.microrel.2015.10.027},
url = {http://dx.doi.org/10.1016/j.microrel.2015.10.027},
researchr = {https://researchr.org/publication/ZhouZYLLSW16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {56},
pages = {49-52},
}