Monitoring chip fatigue in an IGBT module based on grey relational analysis

Shengqi Zhou, Luowei Zhou, Litao Yu, Sucheng Liu, Quanming Luo, Pengju Sun, Junke Wu. Monitoring chip fatigue in an IGBT module based on grey relational analysis. Microelectronics Reliability, 56:49-52, 2016. [doi]

Abstract

Abstract is missing.