Characterization of Single-Electron Tunneling Transistors for Designing Low-Power Embedded Systems

Changyun Zhu, Zhengyu Gu, Robert P. Dick, Li Shang, Robert G. Knobel. Characterization of Single-Electron Tunneling Transistors for Designing Low-Power Embedded Systems. IEEE Trans. VLSI Syst., 17(5):646-659, 2009. [doi]

Authors

Changyun Zhu

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Zhengyu Gu

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Robert P. Dick

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Li Shang

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Robert G. Knobel

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