Characterization of Single-Electron Tunneling Transistors for Designing Low-Power Embedded Systems

Changyun Zhu, Zhengyu Gu, Robert P. Dick, Li Shang, Robert G. Knobel. Characterization of Single-Electron Tunneling Transistors for Designing Low-Power Embedded Systems. IEEE Trans. VLSI Syst., 17(5):646-659, 2009. [doi]

Abstract

Abstract is missing.