IBM experiments in soft fails in computer electronics (1978-1994)

James F. Ziegler, Huntington W. Curtis, Hans P. Muhlfeld, Charles J. Montrose, B. Chin, Michael Nicewicz, C. A. Russell, Wen Y. Wang, Leo B. Freeman, P. Hosier, L. E. LaFave, James L. Walsh, José M. Orro, G. J. Unger, John M. Ross, Timothy J. O Gorman, B. Messina, Timothy D. Sullivan, A. J. Sykes, H. Yourke, Thomas A. Enger, Vikram R. Tolat, T. S. Scott, Allen H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus. IBM experiments in soft fails in computer electronics (1978-1994). IBM Journal of Research and Development, 40(1):3-18, 1996. [doi]

Abstract

Abstract is missing.