Analysis of hot carrier-induced degradation of Horizontal Current Bipolar Transistor (HCBT) - researchr publication related

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Josip Zilak, Marko Koricic, Tomislav Suligoj. Analysis of hot carrier-induced degradation of Horizontal Current Bipolar Transistor (HCBT). In Petar Biljanovic, Marko Koricic, Karolj Skala, Tihana Galinac Grbac, Marina Cicin-Sain, Vlado Sruk, Slobodan Ribaric, Stjepan Gros, Boris Vrdoljak, Mladen Mauher, Edvard Tijan, Filip Hormot, editors, 40th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2017, Opatija, Croatia, May 22-26, 2017. pages 77-82, IEEE, 2017. [doi]

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