Electro-Thermal Investigation of SiGe HBTs: A Review - researchr publication authors

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Thomas Zimmer, Sébastien Fregonese, Anjan Chakravorty. Electro-Thermal Investigation of SiGe HBTs: A Review. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2023, Monterey, CA, USA, October 16-18, 2023. pages 44-49, IEEE, 2023. [doi]

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