Thomas Zimmer, Sébastien Fregonese, Anjan Chakravorty. Electro-Thermal Investigation of SiGe HBTs: A Review. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2023, Monterey, CA, USA, October 16-18, 2023. pages 44-49, IEEE, 2023. [doi]
Abstract is missing.