Robustness of Sub-22nm multigate devices against physical variability - researchr publication authors

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Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis. Robustness of Sub-22nm multigate devices against physical variability. In IEEE International Symposium on Circuits and Systems, ISCAS 2017, Baltimore, MD, USA, May 28-31, 2017. pages 1-4, IEEE, 2017. [doi]

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