Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Reis. Robustness of Sub-22nm multigate devices against physical variability. In IEEE International Symposium on Circuits and Systems, ISCAS 2017, Baltimore, MD, USA, May 28-31, 2017. pages 1-4, IEEE, 2017. [doi]
@inproceedings{ZimpeckAMR17, title = {Robustness of Sub-22nm multigate devices against physical variability}, author = {Alexandra L. Zimpeck and Ygor Aguiar and Cristina Meinhardt and Ricardo Reis}, year = {2017}, doi = {10.1109/ISCAS.2017.8050441}, url = {https://doi.org/10.1109/ISCAS.2017.8050441}, researchr = {https://researchr.org/publication/ZimpeckAMR17}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2017, Baltimore, MD, USA, May 28-31, 2017}, publisher = {IEEE}, isbn = {978-1-4673-6853-7}, }