Alexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis. Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET Designs. In 27th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, Cuzco, Peru, October 6-9, 2019. pages 240-241, IEEE, 2019. [doi]
Abstract is missing.