Process variability in FinFET standard cells with different transistor sizing techniques - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Alexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Reis. Process variability in FinFET standard cells with different transistor sizing techniques. In 2015 IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2015, Cairo, Egypt, December 6-9, 2015. pages 121-124, IEEE, 2015. [doi]

This author has not been identified. Look up 'Alexandra L. Zimpeck' in GoogleThis author has not been identified. Look up 'Cristina Meinhardt' in GoogleThis author has not been identified. Look up 'Gracieli Posser' in GoogleThis author has not been identified. Look up 'Ricardo Reis' in Google

runs on WebDSL