The following publications are possibly variants of this publication:
- FinFET cells with different transistor sizing techniques against PVT variationsAlexandra L. Zimpeck, Cristina Meinhardt, Gracieli Posser, Ricardo Augusto da Luz Reis. iscas 2016: 45-48 [doi]
- Impact of variability effects on FinFET transistors and combinational cellsAlexandra L. Zimpeck, Ricardo Reis. icecsys 2016: 440-441 [doi]
- Impact of PVT variability on 20 nm FinFET standard cellsAlexandra L. Zimpeck, Cristina Meinhardt, Ricardo Augusto da Luz Reis. mr, 55(9-10):1379-1383, 2015. [doi]
- Circuit-Level Techniques to Mitigate Process Variability and Soft Errors in FinFET DesignsAlexandra L. Zimpeck, Cristina Meinhardt, Laurent Artola, Guillaume Hubert, Fernanda Lima Kastensmidt, Ricardo Augusto da Luz Reis. vlsi 2019: 240-241 [doi]