Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo Reis. Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices. In 24th International Workshop on Power and Timing Modeling, Optimization and Simulation, PATMOS), Palma de Mallorca, Spain, September 29 - Oct. 1, 2014. pages 1-8, IEEE, 2014. [doi]
Abstract is missing.