Yann A. Zinzius, Georges G. E. Gielen, Willy Sansen. Modelling impact of digital substrate noise on embedded regenerative comparators. In José E. Franca, Rudolf Koch, editors, ESSCIRC 2003 - 29th European Solid-State Circuits Conference, Estoril, Portugal, September 16-18, 2003. pages 253-256, IEEE, 2003. [doi]
@inproceedings{ZinziusGS03,
title = {Modelling impact of digital substrate noise on embedded regenerative comparators},
author = {Yann A. Zinzius and Georges G. E. Gielen and Willy Sansen},
year = {2003},
doi = {10.1109/ESSCIRC.2003.1257120},
url = {https://doi.org/10.1109/ESSCIRC.2003.1257120},
researchr = {https://researchr.org/publication/ZinziusGS03},
cites = {0},
citedby = {0},
pages = {253-256},
booktitle = {ESSCIRC 2003 - 29th European Solid-State Circuits Conference, Estoril, Portugal, September 16-18, 2003},
editor = {José E. Franca and Rudolf Koch},
publisher = {IEEE},
isbn = {0-7803-7995-0},
}