Yann A. Zinzius, Georges G. E. Gielen, Willy Sansen. Modelling impact of digital substrate noise on embedded regenerative comparators. In José E. Franca, Rudolf Koch, editors, ESSCIRC 2003 - 29th European Solid-State Circuits Conference, Estoril, Portugal, September 16-18, 2003. pages 253-256, IEEE, 2003. [doi]
Abstract is missing.