The Test-Cycle Minimization in Parameterized Bus-Oriented Datapath Designs

V. A. Zivkovic, Ronald J. W. T. Tangelder, H. G. Herkhoff. The Test-Cycle Minimization in Parameterized Bus-Oriented Datapath Designs. In 13th Latin American Test Workshop, LATW 2012, Quito, Ecuador, April 10-13, 2012. pages 215-220, IEEE Computer Society, 2000.

Abstract

Abstract is missing.