Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine. A built-in scheme for testing and repairing voltage regulators of low-power srams. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]
@inproceedings{ZordanBDGTVB13-0, title = {A built-in scheme for testing and repairing voltage regulators of low-power srams}, author = {Leonardo Bonet Zordan and Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri and Arnaud Virazel and Nabil Badereddine}, year = {2013}, doi = {10.1109/VTS.2013.6548894}, url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2013.6548894}, researchr = {https://researchr.org/publication/ZordanBDGTVB13-0}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013}, publisher = {IEEE Computer Society}, isbn = {978-1-4673-5542-1}, }