Yervant Zorian. Embedded Memory Test and Repair: Infrastructure IP for SOC Yield. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 340-349, IEEE Computer Society, 2002. [doi]
@inproceedings{Zorian02,
title = {Embedded Memory Test and Repair: Infrastructure IP for SOC Yield},
author = {Yervant Zorian},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430340abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/Zorian02},
cites = {0},
citedby = {0},
pages = {340-349},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}