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Yervant Zorian. Embedded Memory Test and Repair: Infrastructure IP for SOC Yield. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 340-349, IEEE Computer Society, 2002. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Embedded-Memory Test and Repair: Infrastructure IP for SoC YieldYervant Zorian, Samvel K. Shoukourian. dt, 20(3):58-66, 2003. [doi] SoC Yield Optimization via an Embedded-Memory Test and Repair InfrastructureSamvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian. dt, 21(3):200-207, 2004. [doi] Embedding infrastructure IP for SOC yield improvementYervant Zorian. dac 2002: 709-712 [doi] Leveraging Infrastructure IP for SoC YieldYervant Zorian. ats 2003: 3-5 [doi]
The following publications are possibly variants of this publication: